Enhancing PCB Quality Control through AI-Driven Inspection: Leveraging Convolutional Neural Networks for Automated Defect Detection in Electronic Manufacturing Environments

Authors

  • Harshitkumar Ghelani Gujarat Technological University Author

Keywords:

AI-driven inspection, PCB quality control, convolutional neural networks, automated defect detection, sustainable manufacturing

Abstract

The increasing complexity of printed circuit board (PCB) designs necessitates advanced quality control methods to ensure reliability and performance in electronic devices. This paper presents a novel approach to PCB quality control by integrating artificial intelligence (AI) and convolutional neural networks (CNNs) for automated defect detection. We explore the implementation of an AI-driven inspection framework that leverages CNNs to analyze high-resolution images of PCBs, identifying defects that are often missed by traditional inspection methods. By training the CNN model on a diverse dataset of defect types, the system achieves high accuracy and efficiency in recognizing issues such as soldering errors, misalignments, and surface imperfections. Furthermore, this automated approach not only enhances defect detection rates but also significantly reduces inspection time, leading to increased productivity in electronic manufacturing environments. The energy-efficient design of the system supports environmentally friendly practices, contributing to sustainable manufacturing goals. Our findings demonstrate the potential of AI-driven inspection systems to revolutionize PCB quality control, providing manufacturers with a powerful tool to enhance product quality, reduce waste, and improve overall operational efficiency in the fast-evolving electronics industry. This research underscores the importance of adopting advanced technologies to meet the growing demands for high-quality electronic components.

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Published

2024-06-01

How to Cite

Enhancing PCB Quality Control through AI-Driven Inspection: Leveraging Convolutional Neural Networks for Automated Defect Detection in Electronic Manufacturing Environments . (2024). International Journal of Advanced Engineering Technologies and Innovations, 1(3), 719-735. http://ijaeti.com/index.php/Journal/article/view/731

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